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PTAB.US: Decisions of PTAB Patent Trial and Appeal Board Updated Daily.

Friday, September 16, 2011

kronig, boyer, bush, hyatt

REVERSED

1700 Chemical & Materials Engineering
1765 Ex Parte Weber et al 11/019,492 McKELVEY 103(a) 37 C.F.R. § 41.50(b) 112(1) VIDAS, ARRETT & STEINKRAUS, P.A. EXAMINER LISTVOYB, GREGORY

2100 Computer Architecture and Software
2162 Ex Parte Stobbs et al 10/806,307 POTHIER 103(a) HARNESS, DICKEY & PIERCE, P.L.C. EXAMINER CORRIELUS, JEAN M

2181 Ex Parte Barrenscheen et al 10/727,102 DESHPANDE 103(a) DICKSTEIN SHAPIRO LLP EXAMINER LEE, CHUN KUAN

2188 Ex Parte Clark et al 11/054,886 ZECHER 102(b) Yudell Isidore Ng Russell PLLC EXAMINER GU, SHAWN X

2800 Semiconductors, Electrical and Optical Systems and Components
2814 Ex Parte Wang et al 10/952,708 KRIVAK 102(e) Synopsys/Fenwick EXAMINER KALAM, ABUL

3600 Transportation, Construction, Electronic Commerce, Agriculture, National Security, and License & Review
3653 Ex Parte Elgee et al 11/021,650 McCARTHY 103(a) HEWLETT-PACKARD COMPANY EXAMINER MORRISON, THOMAS A

3657 Ex Parte Murakami 10/698,481 BAHR 102(b)/103(a) BIRCH STEWART KOLASCH & BIRCH EXAMINER SY, MARIANO ONG

3700 Mechanical Engineering, Manufacturing, and Products & Design
3746 Ex Parte Williams et al 11/220,831 SAINDON 112(2)/103(a) DYKEMA GOSSETT PLLC EXAMINER BERTHEAUD, PETER JOHN

AFFIRMED-IN-PART

1600 Biotechnology and Organic Chemistry
1656 Ex Parte Wei et al 12/283,347 ADAMS 112(1) 102(a,b) HUGH MCTAVISH MCTAVISH PATENT FIRM EXAMINER MONSHIPOURI, MARYAM

2100 Computer Architecture and Software
2161 Ex Parte Bohannon et al 11/025,846 GONSALVES 103(a) 103(a) Ryan, Mason & Lewis, LLP EXAMINER NGUYEN, CAM LINH T

2161 Ex Parte Boss et al 10/992,572 DESHPANDE 103(a) 103(a) CANTOR COLBURN LLP-IBM YORKTOWN EXAMINER NGUYEN, THU N

2179 Ex Parte Hymes et al 10/633,250 FRAHM 103(a) 103(a) FROST BROWN TODD LLC EXAMINER AUGUSTINE, NICHOLAS

2600 Communications
2611 Ex Parte McCall et al 10/956,426 NAPPI 102(b)/103(a) 102(b)/103(a) BLAKELY SOKOLOFF TAYLOR & ZAFMAN LLP EXAMINER JOSEPH, JAISON

AFFIRMED

1653 Ex Parte Kilminster 10/570,447 ADAMS 103(a) ELMORE PATENT LAW GROUP, PC EXAMINER MARTIN, PAUL C

1700 Chemical & Materials Engineering
1764 Ex Parte Wendker et al 12/093,097 MILLS 103(a) MARSHALL, GERSTEIN & BORUN LLP EXAMINER KAUCHER, MARK S

2100 Computer Architecture and Software
2111 Ex Parte Matthews et al 10/814,426 HUGHES 103(a) HOWISON & ARNOTT, L.L.P EXAMINER DALEY, CHRISTOPHER ANTHONY

Although we apply a somewhat different reasoning than that provided by the Examiner, where, as here, the limitations at issue are found in a single reference and the thrust of the obviousness reasoning remains the same, the Board may rely on a single reference to affirm a multiple reference rejection under 35 U.S.C. § 103(a) without designating it a new ground of rejection. Reliance upon fewer references in affirming a rejection under 35 U.S.C. § 103 does not normally constitute a new ground of rejection. See In re Kronig, 539 F.2d 1300, 1303 (CCPA 1976); In re Boyer, 363 F.2d 455, 458 n.2 (CCPA 1966); In re Bush, 296 F.2d 491, 496 (CCPA 1961); see also Hyatt v. Doll, 576 F.3d 1246, 1276 (Fed. Cir. 2009) (“The Board cannot be said to have presented a new ground of rejection simply by elaborating on the examiner’s rejection or by using different words.”).

Kronig, In re, 539 F.2d 1300, 190 USPQ 425 (CCPA 1976) . . . . . . . . . . . . . . . . . . . . 1207.03

Hyatt v. Dudas, 492 F.3d 1365, 83 USPQ2d 1373, 1376 (Fed. Cir. 2007) . . . . 2163.04


2800 Semiconductors, Electrical and Optical Systems and Components
2871 Ex Parte Gugliotta 11/293,756 KRIVAK 102(b)/103(a) PATENT, COPYRIGHT & TRADEMARK LAW GROUP EXAMINER NGUYEN, LAUREN

3600 Transportation, Construction, Electronic Commerce, Agriculture, National Security, and License & Review
3653 Ex Parte Pommereau 10/525,900 ASTORINO 112(2)/102(b) 103(a) GREER, BURNS & CRAIN EXAMINER BUTLER, MICHAEL E

3700 Mechanical Engineering, Manufacturing, and Products & Design
3732 Ex Parte Savic et al 11/343,584 O’NEILL 102(b) Norris, McLaughlin & Marcus P.A. EXAMINER MAI, HAO D

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